Characterizations
•Development of novel MEMS in-situ SEM/TEM characterization systems and novel atomic force microscopy (AFM)-based characterization technologies for multi-physics studies of advanced materials
•Characterizations of mechanical, topological, frictional, electrical, electro-chemical, piezoelectric, and electrostatic properties of structures
•Materials of interests include sub-nm thin films, 2D materials & interfaces, CNTs, nanoparticles, polymer composites, dental materials, biological tissues and cells.
Synthesis
•Controllable synthesis of 1D and 2D materials
•Lithographical patterning of 1D & 2D structures
•Synthesis of 1D & 2D composite structures
Applications
•Advanced materials-based electro-adhesives for multi-scale transfer printing and robotic gripping
•3D printing of nanomaterials-based composites
•Scalable assembly of nanomaterials-based electronic devices
