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Characterizations

•Development of novel MEMS in-situ SEM/TEM characterization systems and novel atomic force microscopy (AFM)-based characterization technologies for multi-physics studies of advanced materials

•Characterizations of mechanical, topological,  frictional, electrical, electro-chemical, piezoelectric, and electrostatic properties of structures

•Materials of interests include sub-nm thin films, 2D materials & interfaces, CNTs, nanoparticles, polymer composites, dental materials, biological tissues and cells.

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Synthesis

•Controllable synthesis of 1D and 2D materials


•Lithographical patterning of 1D & 2D structures


•Synthesis of 1D & 2D composite structures

Applications

•Advanced materials-based electro-adhesives for multi-scale transfer printing and robotic gripping​

•3D printing of nanomaterials-based composites

•Scalable assembly of nanomaterials-based electronic devices